(1)Make a judgment by measuring the positive and negative resistance of each lead of the monolithic integrated circuit to the reference data or another good integrated circuit (note: the same measurement of the same multimeter must be used, the result is accurate) .
(2) In the absence of comparative data, only indirect resistance measurement can be used, that is, it can be judged by measuring the peripheral components (such as resistors, capacitors, and transistors) of the integrated circuit leads on the printed circuit board. If the peripheral components are not damaged, the integrated circuit may be damaged already.
(3) Voltage method. Measure the dynamic and static voltages of the integrated circuit leads to ground and compare them with the reference voltage provided by the wiring diagram or other data. If the lead voltage has a large difference and its peripheral components are not damaged, the integrated circuit may have been damaged.
(4) Waveform method. It is measured whether the waveforms of the lead wires of the integrated circuit are consistent with the original design. If a large difference is found and the peripheral components are not damaged, the integrated circuit may be damaged.
(5) Replacement method. The replacement test is performed with the same type of integrated circuit, and if the circuit restore to normal, the integrated circuit is already damaged.
If there is a problem with the quality of the integrated circuit, then we can replace it with an IC of the exact same type and the same function. Integrated circuits that have the same function and the same numbers in the back are generally interchangeable.