(1) Resistance method.
A. Make a judgment by measuring the positive and negative resistance of each lead of the monolithic integrated circuit with the reference data or compare with another good integrated circuit, (note: the same type of measurement must be used for the same multimeter, the result is correct .)
B.In the case of no comparison data, the indirect resistance method is used intelligently, that is, it is judged by measuring the peripheral components (such as resistors, capacitors, and transistors) of the integrated circuit leads on the printed circuit board. If the peripheral components are not damaged, the integrated circuit may be damaged.
(2) Voltage method
Measure the dynamic and static voltages of the integrated circuit leads to ground and compare them with the reference voltage provided by the wiring diagram or other data. If the lead voltage has a large difference and its peripheral components are not damaged, the integrated circuit may be damaged.
(3) Waveform method
It is measured whether the waveforms of the lead wires of the integrated circuit are consistent with the original design. If a large difference is found and the peripheral components are not damaged, the integrated circuit may be damaged.
(4) Replacement method
Replace the test with the same type of integrated circuit. If the circuit returns to normal, the integrated circuit has been damaged.